Agilent Technologies G1820-60398 RF Match Assembly Module Working Surplus Removed from a FEI Company

Removed from a FEI Company XL 830 DualBeam FIB-SEM Focused Ion Beam-Scanning Electron Microscope System This Philips 4022

Part No: 0200-09072

Part No: 02-332411D01 Model No:

Configured for COMBO

img{max-width:100%} Nikon Binocular Eyepiece Microscope Assembly CFWN 10x/20 OPTISTATION 3 Used

Agilent Technologies G1820-60398 RF Match Assembly Module Working Surplus Removed from a FEI CompanyAgilent Technologies G1820 60398 RF Match Assembly Module Working Surplus Part No: G1820 60398 This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 24"x24"x24" @ 20 lbs. Shipping Terms: All Domestic and International shipping quotes and or fees are subject to change due to packaging