Edwards NRB441000 Active Inverted Magnetron Gauge AIM-XL-MSEAL New Surplus Part No: 4S013-373-3

Part No: 4S013-373-3

EXIT APERTURE

Removed from a JEOL JWS-2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL AP002778-00 ARCNET ITF PB PCB Card is used working surplus

Part No: F30 Chuck O-Ring

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Edwards NRB441000 Active Inverted Magnetron Gauge AIM-XL-MSEAL New Surplus Part No: 4S013-373-3Edwards NRB441000 Active Inverted Magnetron Gauge AIM XL MSEAL New Surplus Part No: NRB441000 Model No: AIM XL MSEAL CE Marked Made in the United Kingdom This item is new surplus. The physical condition is great. This new unit was removed from an evaluation testing system with very little to no prior use and is in like new condition but may show wear from the deinstallation and or transportation procedure. Does not include documentation. Sale Details