Semiconductor Process 300mm Notched Silicon Wafer 12” Test Lot of 24 Surplus img{max-width:100%} AMAT Applied Materials 200mm

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Removed from a JEOL JWS-7555S Wafer Defect Review SEM Scanning Electron Microscope System This JEOL BP101506-00 Processor PCB Card is used working surplus

Semiconductor Process 300mm Notched Silicon Wafer 12” Test Lot of 24 Surplus img{max-width:100%} AMAT Applied Materials 200mmSemiconductor Process 300mm Notched Silicon Wafer 12 Test Lot of 24 Surplus Model No: 300mm Notched Wafer This item is working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x H = 20" x 20" x 20" @ 20 lbs. Shipping Terms: All Domestic and International shipping quotes and or fees are subject to change due to