JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Part No: 0033116-001

Part No: 0033116-001

3 is used working surplus

Part No: VTEK-45642

Estimated Packed Shipping Dimensions: L x W x H = 28"x18"x18" @ 57 lbs

img{max-width:100%}img{max-width:100%} ASML 4022 471 4042 Circuit Board Used Working

JEOL Column Electron Detector Assembly JWS-2000 Wafer Defect Review SEM Working Part No: 0033116-001JEOL Column Electron Detector Assembly JWS 2000 Wafer Defect Review SEM Working Part No: Electron Detector Assembly Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System This JEOL Column Detector Assembly is working surplus. Removed from a JEOL JWS 2000 Wafer Defect Review SEM Scanning Electron Microscope System. The physical condition is good, but there are signs of previous use and handling. Sale Details Item