GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Input Current: 4MA 20M

Input Current: 4MA 20M

img{max-width:100%} Omron Z4LC-C28 Parallel Beam Line Sensor NSR-S307E DUV Scanning System As-Is

img{max-width:100%} OnTrak Systems 28-8875-038 SMIF Relay Board PCB Card - CE 96 Used Working

Part No: BUS-PAC(PC)E

Part No: 696-6004

GW Electronics Type 43 Infrared Chamberscope JEOL JSM-6300/6400F Working Surplus Input Current: 4MA 20MGW Electronics Type 43 Infrared Chamberscope JEOL JSM 6300 6400F Working Surplus Inventory # 21122 Part No: Type 43 For use with the JEOL JSM 6300 6400F SEM Scanning Electron Microscope System This GW Electronics Type 43 Infrared Chamberscope is used working surplus. The physical condition is good, but there are signs of previous use and handling. Sale Details Item Condition: Used Working, 90 Day Warranty Estimated Packed Shipping Dimensions: L x W x